Description: "MFP-3D Origin™ features high-resolution imaging, supports large samples, most imaging modes, and many accessories. High-resolution imaging in both air and fluid — 120 µm XY range and 15 µm Z (40 µm optional) Nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus) Large range of nanoelectrical and electromechanical characterization modes"

AFM Related Publications:

• Direct use of RAPM in laboratory study on diffusion between asphalt binders

Description: Photon correlation spectroscopy and electrophoretic light scattering ,Measurement range: Size: 0.6nm-7um, Zeta Potential: +/-100mV Sample concentration: 0.001% to40%, Minimum sample volume: Size: 60uL Zeta Potential: 2ml,Scattering Angles(s):15, 30, 165 deg.,Light Source: 2Lasers diodes, Wave Length: 658 nm, Intensity: 30mW Delsa Nano C is a photon correlation spectroscopy (PCS) instrument, which determines particle size by measuring the rate of fluctuations in laser light intensity scattered by particles as they diffuse through a fluid. For measuring the zeta potential, it determines electrophoretic movement of charged particles under an applied electric field. The Delsa Nano also can measure zeta potential (or surface charge) of a solid surface or film.

Description: "In its Expert configuration, the DSA25 Drop Shape Analyzer is designed for determining the wettability of solids by means of the contact angle as well as the surface tension of liquids such as coating substances or adhesives. The combination of speed and versatile evaluation options, the analyses give quick feedback to pretreatment steps in quality control but also allow assessing the resulting adhesion.Helps in measuring Static contact angle,Contact angle using a bubble in a liquid , Surface free energy (SFE) according to the following models: Owens-Wendt-Rabel-Kaelble (OWRK), Fowkes, Wu, Zisman, Equation of State, Work of adhesion, solid/liquid interfacial tension, spreading coefficient, Advancing and receding contact angle,roll-off angle,Surface tension of a liquid and interfacial tension between two liquids.

• Direct sample visualization with an ellipsometry contrast image with a lateral resolution as small as 1 micron
• Imaging ellipsometry in the wavelength range from 250 nm to 1700 nm
• High range of accessories to cope with a variety of applications (SPR or solid/liquid cells, light guide for liquid/liquid interfaces, microfluidic, temperature control, electrochemistry cells and many more)
• Real time ellipsometry contrast images provide a fast view of the surface, any defects or structures
• Parallel measurement of multiple areas within the selected field of view
• Knife edge illumination avoids background reflection and allows measurements on thin transparent substrates

• Rotation (theta)-360 Degree
• Pixel Standard-1024 x 1024, Optional 1536 x 1536 or 1920 x 1920 (optical mode)
• Optical Camera Color camera with-1.5 x 1.5mm FOV(contact mode)
• Step heights measurement
• Surface Roughness measurement
• Quantify scratch and dig features, wear depth, width and volume
• Flatness or curvature measurement
• 2D thin film stress measurement
• Film thickness
• Surface Profiling - defect, features etc

• Optical Mode: Vertical Resolution- 0.1nm, 0.02nm, Scan Range Up to-150mm x 150mm (Optional 200mm or more), objective – 5x, 20x, 50x. Z focusing range-0.1 nm to 10mm
• Contact Mode: Vertical Resolution-0.1nm with fine range; 0.01um with coarse range, Vertical Dynamic Range-Up to 5um with fine range; up to 2000um with coarse range, Scan Range-Up to 150mm x 150mm (upgrade available), XY Piezo Stage Resolution-0.1um, Stylus Loading Force-0.01mg to 100mg,

Description: Fourier-transform infrared spectroscopy (FTIR) is a technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid or gas. An FTIR spectrometer simultaneously collects high-resolution spectral data over a wide spectral range.

Description: Ultraviolet–visible spectroscopy or ultraviolet–visible spectrophotometry (UV–Vis or UV/Vis) refers to absorption spectroscopy or reflectance spectroscopy in part of the ultraviolet and the full, adjacent visible regions of the electromagnetic spectrum.

Description: X-ray diffraction is a powerful non-destructive technique for characterizing crystalline materials. It provides information on structures, phases, preferred crystal orientations (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects.

Description:
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