ACMS

Electrical Characterization Facility

Oscilloscope

New User Charges for the instrument in the Electrical Characterization Facility
Note*: All service tax has to be changed as per GOI

S.No.

Instrument Name

Charges (In ₹)
(For IIT Kanpur)

Charges (In ₹)
(For academic Institutions and Govt. Research Labs)

Charges (In ₹)
(Industry and Private Laboratories)

1.

Ambient to high temperature probe station [A]

₹ 200 per hour – Ambient condition

₹ 300 per hour – High temperature

₹ 400 per hour + 18% (G.S.T)

(Both for ambient and high temperature)

₹ 800 per hour + 18% (G.S.T)

2.

Low temperature probe station [A] [B]

₹ 400 per hour

₹ 800 per hour + 18% (G.S.T)

₹ 1600 per hour + 18% (G.S.T)

3.

Hall Effect Measurement

₹ 200 per sample

₹ 300 per hour – Temperature dependent

Temperature (300 K To 350 K)

₹ 400 per sample + 18% (G.S.T)

₹ 500 per hour + 18% (G.S.T)

 – Temperature dependent

Temperature (300 K To 350 K)

₹ 800 per sample + 18% (G.S.T)

₹ 900 per hour + 18% (G.S.T)

 – Temperature dependent

Temperature (300 K To 350 K)

4.

Sheet resistance measurement

₹ 100 per sample

₹ 200 per sample + 18% (G.S.T)

₹ 400 per sample + 18% (G.S.T)

5.

Oscilloscope 

₹ 300 per hour

₹ 500 per hour + 18% (G.S.T)

₹ 1000 per hour + 18% (G.S.T)



A) Along with semiconductor Parameter Analyzer
B) Involves measurements inside a vacuum chamber where the sample platform temperature is being controlled by a close loop cryostat and also a chiller is extracting the heat released by the cryostat.






------------------------------------------------------------------------------------------------------------------------