-
UV-VIS double beam spectrophotometer (Hitachi 150-20)
-
LCZ Meter (Hewlett Packard Model 4276A)
-
Rockwell-type Hardness tester (Buehler Macromet 1)
-
Electromagnet (Polytronic model HEM-75)
-
Programmable electrometer/source (Keithley 617)
-
Null detector/Microvoltmeter (Keithley 155)
-
Optical metallography set-up (grinder, electric polisher, specimen mounting press, Leitz metallurgical microscope)
-
Digital autoranging microvoltmeter (Keithley 197)
-
Debye Scherrer, Oscillation and Laue cameras
-
Strain meter
-
Differential Thermal Analyzer (Linseis)
-
Cryostat (Oxford Instrument )
-
Minimet Polisher (Bueheler)
-
Precision balance
-
Moller interferometer
-
Electrophoresis apparatus
-
Optical spectrometer
-
Gas lasers
-
DPSS laser
-
Hot and cold microscope stage
-
Optical Microscopes
-
CCD detector
-
UHV e-beam evaporation unit
-
RF sputtering unit
-
Low temperature and high temperature electrical characterization system.
-
Temperature controlled universal testing machine
-
Scanning electron microscopy
-
Atomic force microscopy
-
Optical microscopy
-
Two roll mixing mill
-
High temperature hydraulic press
-
Specimen cutting machine
-
Hot isostatic press
-
Micro hardness tester
-
Chemical vapour deposition unit
-
Brabender plastic order
-
High temperature furnace
-
Environmental controlled high temperature furnace
-
Sonicator
-
Differential scanning calorimeter
-
Differential thermal analyzer
-
Dynamic mechanical analyzer
-
Goodrich flexometer
-
Fatigue tester