ACMS

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Booking for Cryogenic Probe Station


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Booking for Probe Station with Heating Stage


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Booking for Semiconductor Parameter Analysis


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Booking for OSCILLOSCOPE


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Booking for Table Top Hall Effect Measurement System


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Booking for Sheet resistance measurement system - Pro4


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Booking for Thermoelectric Characterization System


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Booking for Piezo-electric,Ferro-Electric,PYRO-Electric Materials Characterization


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Booking for Closed Cycle Cryostat with Electro-Magnet


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Booking for Plasma Sputter Coater


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Booking for Near Field Scanning Optical Microscope


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Now you can book slots for Indepance Analyser, LCR Meter and High-Temperature Probostat by filling a single form given below :)

Booking for Inpedance Analyser, LCR Meter and High-Temperature Probostat


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Electrical Charaterization Facility

Location: Room No. 201 ACMS


Current Status: Operational

LOW_PROBELOW_PROBE Key performance specifications

a) Temperature range 10K - 350K
b) Four micromanipulators with triaxial cables
c) One optical arm for LASER excitation of samples (User provides     LASER source)
d) Maximum sample size 1inch x 1inch

Current Status: Operational

pobe_stationpobe_station A platform for measurement of electrical characteristics with help of Semiconductor Parameter Analyzer from ambient to 300ºC.

a) Four micromanipulators with coaxial cables.
b) Two micromanipulators with triaxial cables.
c) Temperature range ambient temperature to 300ºC
d) Maximum sample size 12.7 mm × 12.7 mm
e) Provision for chuck bias






Current Status: Operational

ANALYZERANALYZER 1. DC Current-Voltage measurement:
     1.1 Current source/measure from 1 pA to 1 Amp
     1.2 Voltage source/measure from 210 mV to 200 Volt

2. CV measurement:
     2.1 Frequency = 1 kHz to 10 Mhz and 10 mHz to 10 Hz

3. Pulse IV:
   3.1 Frequency range 1 Hz to 50 MHz; time resolution for        measurement = 10 nano-sec





Current Status: Operational

OSCILLSCOPEOSCILLSCOPE Key performance specifications

a) 1 GHz, 500 MHz, 350 MHz, and 100 MHz bandwidth models
b) 2 and 4 analog channel models
c) Up to 5 GS/s sample rate on all channels
d) Up to 20 mega-point record length on all channels
e) >50,000 wfm/s maximum waveform capture rate
f) Standard passive voltage probes with less than 4 pF capacitive loading and 500 MHz or 1 GHz analog bandwidth
g) Suite of advanced triggers





Current Status: Operational

HMS_1HMS_1 1) Measurement capability:

1.1) Resistivity, type of conductivity, mobility and doping level in a material.
1.2) User has to provide the thickness of thin-film.

2) Magnetic-field strength :

2.1) Magnetic field strength → 0.55 ± 0.03 Tesla (permanent magnet)

3) Sample Size:

3.1) SAMPLE HOLDER MODEL NO. – SH80350K
3.1.1) Temperature: 80 K - 350 K
3.1.2 Maximum sample thickness → Less than 2 mm
3.1.3 Maximum sample size → 10 mm × 10 mm

3.2) SAMPLE HOLDER MODEL NO. – SPCB-21
3.2.1) Only for room temperature measurement
3.2.2 Maximum sample thickness → Less than 2 mm
3.2.3 Maximum sample size → 15 mm × 15 mm




Current Status:Operational

Pro_4_ResistivityPro_4_Resistivity # Measurement capability:

a) The resistivity measurements of the sheet and bulk samples.
b) Quick measurement of sheet resistance of thin-films, semiconductor wafer.

CONTACT


 

Instrument Name

Faculty in charge

Staff in charge

Staff

1.

Low temperature Probe station

Dr. Sarang Ingole

sarang@iitk.ac.in

Mr. R. P. Singh

rpsingh@iitk.ac.in

(O) 0512-259-7879

Mr. Pushpendra Kumar

pkdohare@iitk.ac.in

(O) 0512-259-7879

2.

Probe Station with Heating Stage

3.

Semiconductor Parameter analyzer, along with an Oscilloscope

4.

Table Top Hall Measurement System

5.

Sheet resistance measurement system


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Current Status: Operational

zem_3
Thermoelectric characterization system for bulk and thin film samples

Temperature Capability:
Thermoelectric characteristic evaluation of a wide range of materials from 50°C to 1000°C under helium gas ambient

Type and dimensions of samples allowed:
1. Pellet with radially two ends polished flat as shown in the schematic below.
2. Rectangular bar
For case (1.) and (2.) the surface of sample making contact with the electrodes would be in between 2x2 to 4x4 mm2. The distance between the two electrodes could be in the range of 5 to 22 mm only.
3. Cylindrical bar: - The diameter could be in the 2 – 4 mm range and the length should be in the range of 5 to 22 mm only.
4. Thin-film: - Use the special holder that has been provided for this purpose.

Current Status: Operational

Piezo_1Piezo_1 MEASUREMENT VARIABLES:

1 For piezo sample holder unit:
1.1 Sample diameter → 3 mm to 25 mm
1.2 Sample thickness → 0.1 mm to 5 mm
1.3 Internal heater temperature range → 20 degree Celcius to 800 degree Celcius
1.4 Use of silicon oil possible to increase the flash-over voltage.

2 For thin film sample holder unit:
2.1 Maximum sample size allowed→ 25 mm × 25 mm
2.2 Sample thickness → 0.1 mm to 10 mm
2.3 temperature range → 20 degree Celciusto 250 degree Celcius

MEASUREMENT:

* DHM – Dynamic Hysteresis Measurement
* PM – Pulse Measurement
* SHM – Static Hysteresis Measurement
* LM – Leakage Current Measurement
* FM – Fatigue Measurement
* RM – Retention Measurement
* IM – Imprint Measurement


Current Status: Down

CryostatCryostat INSTRUMENT: Advanced Research Systems (ARS) closed cycle cryostat CS202AI-DMX-1SS with GMW 5403 Electromagnet Magnetic Field strength = 0.6 T

Measurement:
# Magneto resistance measurement/Hall effect measurement
# Hall measurements from 10K to 800K.
# Magnetic field strength = 0.6T

note* Currently the arrangement for placing cryostat head between the poles of the magnet is not available.








Current Status: Down

COATERCOATER Key performance specifications

# Metal deposition on the sample back side for better electrical contact during measurement.






Current Status: Down

NSOMNSOM Multimodal NSOM provides simultaneous measurements of the topography and direct correlation between surface nano-features with resolution less than 50 nm and optical/electronic properties

Mode of Operations

•Near-field scanning optical microscopy
• Reflection NSOM (NSOM) is a microscopy technique to probe
• Collection Mode nanostructures with resolution of 10-20 nm
• Transmission Mode in lateral dimensions and 2-5 nm in vertical dimensions.
• Apertureless NSOM
• Near-field Illumination & Near-field Scattering and/or Collection with Multiple AFM/NSOM probes


NOSMNSOM Special Features

• Multimodal NSOM provides unique opportunity to conduct simultaneously various electrical and optical characterizations for nano structured materials like nanowires, nano-particles etc.
• Direct mapping of photocurrent for solar cell
• Imaging optoelectronic devices & films: A combination of emission and bias modulation for LED and photovoltaic devices.
• Single-Molecule Spectroscopy (SMS) and Imaging
• Surface plasmonpolaritons for chemical and bio sensing devices.
• Crystallographic defects at the nanometer scale

CONTACT


 

Instrument Name

Faculty in charge

Staff in charge

Staff

1.

Thermoelectric characterization system

Dr. Tanmoy Maiti

tmaiti@iitk.ac.in

Mr. R. P. Singh

rpsingh@iitk.ac.in

(O) 0512-259-7879

Mr. Pushpendra Kumar

pkdohare@iitk.ac.in

(O) 0512-259-7879

2.

Piezo-electric, Pyro-electric, and Ferro-electric characterization  facility

3.

Close Cycle Cryostat with magnet

4.

Table top sputter coater

5.

Near Field Scanning Optical Microscope(NSOM)


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Current Status: Operational

impedance analyserCOATER Solartron 1260A   Applications
  • Corrosion studies
  • Battery research and fuel cells
  • Solar cells
  • LCDs
  • Bio-materials
  • Ceramics / composites
  • Electronic component development
  • Civil Engineering

Features

# Wide frequency range
• Spanning 10 μHz to 32 MHz with 0.015ppm resolution, this analyzer provides excellent coverage for virtually all chemical and molecular mechanisms.

# Noise free analysis
• Frequency resolution: 1 in 65 million (0.015 ppm)
• 0.1%, 0.1° accuracy
• Resolution to 0.001 dB, 0.01°
• Measures impedances >100 MΩ
• 2-, 3- and 4- terminal measurement configurations
• Polarization voltage up to ±40.95 V


Current Status: Operational

LCRLCR Measurement Capabilities

• Fourteen parameters can be measured- |Z|, |Y|, θ, Rp, Rs, G, X, B, Lp, Ls, Cp, Cs, D (tan δ) and Q
• Inductance of winding, floating capacitance
• Characteristics at operating frequency and low frequency resistance components
• Four simultaneous measurement parameters at a time
• Inductance (L) and DC resistance (DCR) can be measured by the same unit

Features

• High frequency range (42 Hz to 5 MHz)
• High resolution and high accuracy (± 0.08%)
• Fastest measurement time 5 ms
• Interactive touch panel operation
• Can be interfaced with the computer


Current Status: Operational

COATERCOATERNorecs make High Temperature Probostat Features

• Conductivity vs. T, pO2, pH2O etc.
• DC, AC impedance spectroscopy
• Dielectric properties loss etc.
• 2 and 4 electrodes
• Ionic transport number
• I-V characteristics
• Fuel cell components (Electrolyte, Anode/Cathode) and single cell testing

COATERCOATERGEN'AIR Oxygen Pump Gauge Features

•Generate oxygen partial pressure between 0.25 and 10-35 atm
• Use of different kinds of carrier gases, at various concentrations such as Ar, H2, O2, CO2, CO, Air etc.
• Low gas consumption: necessary flow 1 to 12 l/h
• Control of the applied voltage and current
•0 – 20 mA or 4 – 20 mA, linear, with galvanic insulation RS232 port

CONTACT


rpsingh@iitk.ac.in

 

Instrument Name

Faculty in charge

Staff in charge

Staff

1.

Impedance Analyzer

Dr. Shobit Omar
somar@iitk.ac.in

Mr. R. P. Singh

rpsingh@iitk.ac.in

(O) 0512-259-7879

Mr. Pushpendra Kumar

pkdohare@iitk.ac.in

(O) 0512-259-7879

2.

LCR Meter

3.

High-Temperature Probostat









 

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