ACMS

Electron Microscopy Lab

Location: ACMS 112

Instrument: Electron Probe Micro-Analyser(EPMA)
Model/Supplier: JXA-8230;JEOL.

electronelectron This is a W/laB6 based EPMA with four channels for WDS analysis along with an EDS detector. EPMA is the most accurate technique for micro-composition analysis. Both standard and standardless analyses are possible in point, line or area scan modes. Elemental mapping with high resolution can be done with both WDS and EDS techniques. Quantitative analysis of all elements from B to U is possible.

� laB6 gun provides the best combination of beam stability and resolution.
� Range of elements:B to U.
� Accelerating voltage:0.2 to 30kV.
� Probe current:10-12 to 10-5 nA.
� Probe current stability:+/-0.05%/h.
� SE Image Resolution:5nm
� WDS wavelength detection:0.087 to 9.3nm
� Four channels ensure fast analysis for multicomponent alloys and minerals

CONTACT

Convener: Prof. Gouthama (gouthama@iitk.ac.in) Internal:7450
Co-Convener: Prof. K. Kulkarni (kkaustub@iitk.ac.in) Internal:6102
Lab Incharge: M.Siva Kumar (rmuthu@iitk.ac.in) Internal:6292, 6031
Mitesh Shrotriy(mitesh@iitk.ac.in) Internal:6284,6293
Jaikishan(jai@iitk.ac.in) Internal:6284,6293


Instrument : Tungsten-Electron Microscope(W-SEM)
Model/Supplier: JSM-6010LA;JEOL

images (1)images (1) This is a compact SEM for the quick image analysis with high resolution and compositional information. The integral EDS detector can be used for micro-compositional analysis.

Features

� BSE Resolution:5mn at 20kV
� Magnification:5x to 300000x
� Accelerating voltage: 0.5 to 20kV
� Automatic SEM condition set-up based on sample type

 


Instrument : FEI
Model/Supplier: Quanta 200

images (1)images (1) This is a state of the art SEM from FEI for extensive image analysis with high resolution and compositional information. The integral EDS detector can be used for micro-compositional analysis.

Features

* SE Resolution better than 2.0 nm at 20kV.
* Magnification:5x to 500000x.
* EDS and EBSD detector for quantitative analysis.
* Supports biological and polymeric samples.

CONTACT

Convener: Prof. Gouthama (gouthama@iitk.ac.in) Internal:7450
Lab Incharge: M.Siva Kumar (rmuthu@iitk.ac.in) Internal:6292, 6031
Mitesh Shrotriy(mitesh@iitk.ac.in) Internal:6284,6293
Jaikishan(jai@iitk.ac.in) Internal:6284,6293

How to book slots

SEM slots can only be booked online in three steps.

Click the link "Request Slots" and fill in the details as requested. You can select an empty slot upto 1 month in advance and only for week days. You can check the availability of slots using the module "Check Slot" or you can check "Booking status" to see all the slots which have already been taken.

Once you submit the request, an invoice will be generated. Please submit this invoice to Mr. M. Siva kumar (Ph. 6031) within 48 hours. If you do not submit within this time lime, your slot will get automatically cancelled and will be open for booking again.

Lab-in-charge will then accept your booking and you can check your status at "Booking status".

Please note that we will soon make this procedure paperless, but until then you will have to submit the paper invoice.

Following slots are available to users:

Slots for W-SEM

9.30 to 11.30
11.30 to 1.30
2.30 to 4.30
  Slots for EPMA


  9.30 to 12.30
  2.30 to 5.30

Non-IITK Users:

1. The online booking is valid only for IITK users.
2. Non-IITK users need to send an email to Mr. Sivakumar (rmuthu@iitk.ac.in) with details of the sample. Users are responsible for proper preparation of their sample. Once we are satisfied that your sample is ready and suitable for our EM, we will book a slot for you and convey you the date and time and the charges for the slot. Please see "User Charges" to get an estimate of the charges for utilizing the facility.
3. Non-IITK Users must send in advance, a Demand Draft, in favor of "Registrar, IIT Kanpur" for the requisite user charges (inclusive of service taxes, 12.36%)
4. If you have an urgency and you want to get your samples characterized on a speedy basis, then you may be allowed to come along with your prepared sample and the demand draft. However your must confirm with Mr Sivakumar (rmuthu@iitk.ac.in) before coming here to the facility.


EM Accessories:

IMG_1466IMG_1466
Instrument: Carbon Sputter Coating Unit
Model/Supplier: JEC 560;JEOL
IMG_1465IMG_1465
Instrument: Gold Sputter Coating
Unit

Model/Supplier: JEC 3000;JEOL
dmrd_1-2dmrd_1-2
Instrument: Optical Microscope
with Differential Interference
Contrast (DIC) Imaging Capability

Model/Supplier: Carl Zeiss GmbH
accessories1accessories1
Instrument: Plasma Cleaner
Model/Supplier: JEOL EC-52000IC

 

CONTACT

Convener: Prof. Gouthama (gouthama@iitk.ac.in) Internal:7450
Co-Convener: Prof. S. Shekhar (shashank@iitk.ac.in) Internal:6528
Lab Incharge: M.Siva Kumar (rmuthu@iitk.ac.in) Internal:6292, 6031
Mitesh Shrotriy(mitesh@iitk.ac.in) Internal:6284,6293
Jaikishan(jai@iitk.ac.in) Internal:6284,6293