Equipment

Characterization Tools

  • Optical and Fluorescence Microscopes
  • Scanning Probe Microscopies
  • Imaging and Spectroscopic Ellipsometry
  • NKD film thickness analysis
  • Profilometers (mechanical and optical)
  • Field Emission Scanning Electron Microscope (FESEM)
  • Scanning Electron Microscopy (SEM)
  • X-ray Diffractometer (XRD)
  • Contact Angle Goniometer
  • Atomic Force Microscopy (AFM)
  • Fourier-Transform Infrared Spectroscopy (FTIR)
  • UV-Visible Spectro Photometer
  • DLS and Zeta potentiometer
Fabrication Tools

  • Maskless Photolithography
  • RF Sputtering
  • Reactive Ion Etching
  • Languir-Blodgett Deposition
  • Solution spin, Flow Coating and Electrospinning
  • UV Lithography
  • Micro-Raman
  • Atomic Force Microscopy (AFM)
  • Nanoimprint lithography
  • High temperature furnaces
  • FESEM coupled with Electron Beam Lithography
  • Molecular Printer
  • Ball Mill
  • E-beam and thermal evaporation