Scanning Electron Microscopes (CARL ZEISS EVO-50) with EDS- Oxford Instruments NanoAnalysis and EBSD-Oxford Nordlys detector


The Department houses two Scanning Electron Microscopes (SEM) for research and teaching purpose. Both the instruments equipped with imaging capabilities and analytical facilities.

The basic SEM (CARL ZEISS EVO 50) fitted with W-filament and operates with accelerating voltage upto 30 kV. The microscope with a large specimen chamber can handle large specimens at the analytical working distance of 8.5mm owing to a combination of the inclined detectors and the sharp conical objective lens. The EDS and EBSD attachments provides the compositional details and micro-texture details of the sample respectively. EBSD system enabled with INCA and Aztec analysis software which gathers accurate data at micro- and nanoscales.

Field Emission Scanning Electron Microscope (FEI) with AMETEK EDAX - EDX, EBSD system


The advance SEM (Nova NanoSEM) operates with Field-emission gun, which attains ultra high imaging resolution. The NanoSEm Schottky FEG source allows the user to achieve high imaging resolution at a range of operating voltage 0.2-30 kV. Secondary electron (SE) imaging can be undertaken in both field-free and immersion mode for comprehensive low-to-high resolution imaging of a variety of samples. The Nova NanoSEM is configured with Octan Plus-A Silicon Drift Detector (SDD)-EDS detector, Hikari camera for EBSD and can be manually fitted with a backscattered electron detector for the convenient visualization of compositional differences across the specimen surface. This facility also capable of conducting in-situ analysis in Tensile mode.

This facility includes gold sputter coater for coating on non-conducting samples. This facility is mainly used for research purpose as well as teaching. Apart from IITK users, this facility also opened for the users from other academic institutions, national research labs and industries.