Measurement of the dielectric constant and loss tangent of materials in microwave frequency band using a rectangular waveguide cavity.

Prof. M J Akhtar and Prof. K V Srivastava   

References

  • "Microwave Engineering", Third Edition, David M. Pozer.

  • "Microwave Devices and Circuits",Third Edition, Samuel Y.Liao.

  • "Field and Wave Electromagnetics", Second Edition, David K.Cheng.

  • "Electromagnetic Waves and Radiating System", Second Edition, Edward C.Jordan, Keith G.Balmain.

  • Computer Simulation Technology (CST), Darmstadt, Germany, 1998-2003.[online]. Available:http://www.cst.com

  • Agilent Application Note - 11949698, "Basics of Measuring The Dielectric Properties of Materials"





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