Atomic Force Microscopy facility (Park XE 70)

Users desirous of using the facility may fill up the booking form available at

A new Atomic Force Microscopy facility has been established under the CARE funding 2013 and is now operational. The AFM is a Park XE 70 machine with a 100micron X 100 micron scanner head and a liquid cell.


Accurate XY Scan by Crosstalk Elimination

  • Independent, loop XY and Z flexure scanners for sample and probe tip
  • Flat and orthogonal XY scan with low residual bow
  • Out of plane motion of less than 2 nm over entire scan range
  • Accurate height measurements without any need of software processing
Best Life, by True Non-ContactTM Mode
  • 10 times faster Z-servo speed than competing AFM piezo tube
  • Less tip wear for prolonged high-quality and high-resolution imaging
  • Minimized sample damage or modification
  • Immune from parameter-dependent results observed in tapping imaging
The Most Extensible AFM Solution
  • The most comprehensive range of SPM modes
  • The largest number of sample measurement options
  • The best option compatibility and upgradeability in the industry
The Best User Convenience by Design
  • Open side access for easy sample or tip exchange
  • Easy, intuitive laser alignment with pre-aligned tip mount
  • Easy head removal by dovetail-lock mount
  • Direct on-axis optics for high resolution optical viewing
  • Decoupled XY & Z
  • True Non-Contact ModeTM
  • Flexure Guided XY Scanner
  • High Force Z-scanner
  • SLD Head
  • Accessible Sample Holder
  • Pre-aligned Cantilever Holder
  • Manual XY Sample Stage
  • Dovetail Lock Head Mount
  • Manual Optics Stage
  • Direct On-Axis View
  • Low Noise Floor

User Charges:

Rs. 1000 for 2 hours

A user fee of Rs. 1000 for a 2 hour slot will be applicable.

Department of Physics
IIT Kanpur

Prof. S. Anantha Ramakrishna
This email address is being protected from spambots. You need JavaScript enabled to view it.