ZSX Primus

ZSX Primus II Wave length Dispersive X-Ray Fluorescence Spectrometer
XRF is used to determine chemical composition of all kinds of materials. The materials can be in solid, liquid, powder, filtered or other form. The method is fast, accurate and non-destructive, and usually requires only a minimum of sample preparation. Applications are very broad and include the metal, cement, oil, polymer, plastics, and food industries, along with mining, mineralogy and geology, and environmental analysis of water and waste materials. In XRF, X-Rays produced by irradiate the sample. In most of the cases, the source is an X-rays tube but alternatively it could be synchrotron or a radioactive material. The elements present in the sample will emit fluorescent X-ray radiation with discrete energies that are characteristics for these elements. A different energy is equivalent to a different color. By measuring the energies of the radiation emitted by the sample it is possible to determine which elements are present. This step is called Qualitative analysis. By measuring the intensities of the emitted energies it is possible to determine how much of each element is present in the sample. This step is called Quantitative Analysis. Our WD-XRF system can detect elements from Na to U. The concentration range goes from ppm levels to 100%. Generally speaking, elements with high atomic numbers have better detection limits than lighter elements. Specification X-ray Spectrometer assembly tube consisting of: X-ray generator 4kW , 60kV-150mA Primary beam filters with Al25, Ti20, Cu25, Zr150 6 position diaphragm (35, 30, 20, 10, 1, 0.5mm φ) Divergence Slit : 3 positions Receiving Slit : For SC , for F-PC Goniometer Angular Ranges for detectors : SC: 5˚ -118˚ , F-PC 13˚ -148˚ Max Scan Speed : 1400˚ /Min ( 2 ) Angular Reproducibility : + 0.0005˚ Continues Scan : 0.1 – 240 ˚ / Min Detector : For heavy elements SC , Counting linearity : 1000kcps Detector: For light elements F-PC, Counting linearity : 2000kcps Attenuator : IN – OUT Automatic Exchange ( Attenuation 1/10) 3 position slit changer with coarse and fine slit Windows XP Software with SQX including Library
Location
X-Ray Fluorescence Laboratory Room No. 101, ACMS Building IIT Kanpur
Contact
Prof. Debajyoti Paul This email address is being protected from spambots. You need JavaScript enabled to view it.
User Charges
IIT Kanpur users INR. 1000 per sample (10 Major element oxides & 20 selected trace elements) Outside IITK users INR. 1200 per sample (10 Major element oxides & 20 selected trace elements) Industry & Consultancy Work INR. 2000 per sample (10 Major element oxides & 20 selected trace elements) (Service tax is applicable for outside IITK users)

Specification