Facilities
Nanolab offers a host of software and hardware facilities for research and development
Characterization Facilities
A broad range of measurement systems for characterizing advanced devices.
B1500
Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
B1505
The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz – 5 MHz). It can also perform fully automated capacitance measurements such as Ciss, Coss and Crss at high voltage biases (up to 3000 V), gate charge, another important parameter for high frequency switching converter era, can be evaluated easily. Automatic thermal characterization from -50 ℃ to +250 ℃ is also supported.
N5244A
The combination of two internal signal sources, a signal combiner, S-parameter and noise receivers, pulse modulators and generators, and a flexible set of switches and RF access points provide a powerful hardware core for a broad range of linear and nonlinear measurements, all with a single set of connections to the device-under-test (DUT) This makes the PNA-X the world’s most integrated and flexible microwave test engine for measuring active devices like amplifiers, mixers, and frequency converters.
Maury Microwaves AM3200
AM3200 is a useful instrument for all the Pulse IV or Load Pull applications. This Pulse IV system is used to bias transistors in quasi-isothermal conditions, it enables accurate compact modeling activities. The system consists of two independently operating power modes: Pulsed or DC (continuous mode). PIV 3200 supports LAN & USB connections and is mainly controlled with IVCAD software.
Summit 11000 Probe Station
Summit series platforms lead the industry in onwafer measurements. 200mm wafer characterization facility : DC, CV and RF characterization of semiconductor devices, for temperature range -65C to 200C.
Keysight N8975B Noise Figure Analyzer
The N8975B high performance noise figure analyzer is designed to make fast, accurate and repeatable noise figure measurements. When paired with an SNS Series noise source and U7227 Series USB preamplifier the ENR data from the SNS and USB preamplifier data automatically downloads into the N8975B. The N8975B has a multi-touch interface that allows stretch, pinch, and drag gestures. Most menus can be accessed with the tap of a finger without changing screens. Noise source calibrations for Y-Factor measurements have been streamlined by allowing combined calibrations for up to 12 DUT setups in a single step. Saving valuable test time can be achieved for many types of DUT’s by using the internal calibration feature, which does not require a user calibration to be performed. A built-in noise figure uncertainty calculator can prepopulate data from the SNS noise source, USB preamplifier, as well as all the required instrument parameters such as analyzer noise figure, gain and noise figure uncertainty, and match. Default noise figure settings offer simultaneous noise figure and gain measurements.
Simulation Suites
A broad range of simulation packages for developing accurate device models
