Atomic Force Microscopy facility (Park XE 70)
Users desirous of using the facility may fill up the booking form available at http://home.iitk.ac.in/~sar/AFM_CARE2013.pdf
A new Atomic Force Microscopy facility has been established under the CARE funding 2013 and is now operational. The AFM is a Park XE 70 machine with a 100micron X 100 micron scanner head and a liquid cell.
Application:
Accurate XY Scan by Crosstalk Elimination
- Independent, loop XY and Z flexure scanners for sample and probe tip
- Flat and orthogonal XY scan with low residual bow
- Out of plane motion of less than 2 nm over entire scan range
- Accurate height measurements without any need of software processing
Best Life, by True Non-ContactTM Mode
- 10 times faster Z-servo speed than competing AFM piezo tube
- Less tip wear for prolonged high-quality and high-resolution imaging
- Minimized sample damage or modification
- Immune from parameter-dependent results observed in tapping imaging
The Most Extensible AFM Solution
- The most comprehensive range of SPM modes
- The largest number of sample measurement options
- The best option compatibility and upgradeability in the industry
The Best User Convenience by Design
- Open side access for easy sample or tip exchange
- Easy, intuitive laser alignment with pre-aligned tip mount
- Easy head removal by dovetail-lock mount
- Direct on-axis optics for high resolution optical viewing
|
