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Atomic Force Microscope |
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Atomic Force Microscope and is often called the "Eye of Nanotechnology". AFM is a high- resolution imaging technique that can resolve features as small as an atomic lattice in the real space. It allows to observe and manipulate molecular and atomic level features. This AFM is capable of scanning large areas with high resolution. Conducting AFM, MFM, imaging in liquid media, atomic level manipulations, dip pen lithography and local anodic oxidation are some of the salient features of this microscope |
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Location: |
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Thematic Unit of Excellence, |
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Contact: |
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Prof. Ashutosh Sharma This email address is being protected from spambots. You need JavaScript enabled to view it. Dr. Prabhat Dwivedi This email address is being protected from spambots. You need JavaScript enabled to view it. Dr. Dinesh Deva This email address is being protected from spambots. You need JavaScript enabled to view it. |
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