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SNOM/Confocal/μRa |
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WITec, alpha 300 series microscope, includes the Confocal Raman Microscope, the Scanning Near-field Optical Microscope (SNOM) and the Atomic Force Microscope in a single integrated unit. Switching between the different modes can easily be done by rotating the objective turret. The alpha SNOM uses unique micro-fabricated SNOM-cantilever sensors for optical microscopy with spatial resolution below the diffraction limit. The micro-Raman represents a new generation imaging systems, focusing on high resolution as well as high speed spectrum and image acquisition. Its sensitive setup allows for the nondestructive imaging of chemical properties without specialized sample preparation. Differences in chemical composition, although completely invisible in the optical image, will be apparent in the Raman image and can be analyzed with a resolution down to 200 nm. The confocal setup reduces unwanted background signals, enhances contrast and provides depth information. Atomic Force Microscope (AFM) modules present in this instrument designed specifically for Materials Research, Nanotechnology, and Life Science. It integrates a scientific-grade optical microscope for superior optical access, easy cantilever alignment, and high resolution sample survey. All standard AFM modes as well as Confocal Microscopy and Confocal Raman Microscopy and SNOM are supported and offer extraordinary opportunities for R&D. |
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Location: |
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Thematic Unit of Excellence, |
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Contact: |
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Prof. Ashutosh Sharma This email address is being protected from spambots. You need JavaScript enabled to view it. Dr. Prabhat Dwivedi This email address is being protected from spambots. You need JavaScript enabled to view it. Dr. Dinesh Deva This email address is being protected from spambots. You need JavaScript enabled to view it. |
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